Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications

التفاصيل البيبلوغرافية
العنوان: Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications
المؤلفون: Prigann, Sven, Feil, Maximilian W., Reisinger, Hans, Bissinger, Jochen, Strasser, Marc, Waltl, Michael, Schlipf, Johannes, Kaya, Turgay, Bartholomaus, Lars, Gustin, Wolfgang, Basler, Thomas
المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :394-397 Jun, 2024
Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350394825
تدمد:19460201
DOI:10.1109/ISPSD59661.2024.10579645