التفاصيل البيبلوغرافية
| العنوان: |
A Discrete Channel Model to Estimate Threshold Voltage Deviation Induced by The Voltage Stress in SiC Short Channel MOSFETs |
| المؤلفون: |
Li, Junze, Guo, Qing, Liu, Li, Wang, Ce, Hu, Zijian, Xu, Hongyi, Li, Yanjun, Wang, Hengyu, Ren, Na, Sheng, Kuang |
| المصدر: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :120-123 Jun, 2024 |
| Relation: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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