Dual Prompt-Based Few-Shot Learning for Automated Vulnerability Patch Localization

التفاصيل البيبلوغرافية
العنوان: Dual Prompt-Based Few-Shot Learning for Automated Vulnerability Patch Localization
المؤلفون: Zhang, Junwei, Hu, Xing, Bao, Lingfeng, Xia, Xin, Li, Shanping
المصدر: 2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER) SANER Software Analysis, Evolution and Reengineering (SANER), 2024 IEEE International Conference on. :940-951 Mar, 2024
Relation: 2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350330663
تدمد:26407574
DOI:10.1109/SANER60148.2024.00102