Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing

التفاصيل البيبلوغرافية
العنوان: Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing
المؤلفون: Alon, Helcy D., Alon, Alvin Sarraga, Evangelista, Ryan S., Ligayo, Michael Angelo Delos Santos, Reyes, Ryan, Reyes, Michelle C., Merin, Jovencio, Austria, Yolanda D.
المصدر: 2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI) Electrical, Energy, and Artificial Intelligence (EICEEAI), 2023 2nd International Engineering Conference on. :1-6 Dec, 2023
Relation: 2023 2nd International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350373363
DOI:10.1109/EICEEAI60672.2023.10590367