مؤتمر
A Review of Degradation in GaN Based HEMTs
| العنوان: | A Review of Degradation in GaN Based HEMTs |
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| المؤلفون: | Shi, Lei |
| المصدر: | 2024 9th International Conference on Electronic Technology and Information Science (ICETIS) Electronic Technology and Information Science (ICETIS), 2024 9th International Conference on. :315-318 May, 2024 |
| Relation: | 2024 9th International Conference on Electronic Technology and Information Science (ICETIS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350388343 |
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| DOI: | 10.1109/ICETIS61828.2024.10593787 |