A Review of Degradation in GaN Based HEMTs

التفاصيل البيبلوغرافية
العنوان: A Review of Degradation in GaN Based HEMTs
المؤلفون: Shi, Lei
المصدر: 2024 9th International Conference on Electronic Technology and Information Science (ICETIS) Electronic Technology and Information Science (ICETIS), 2024 9th International Conference on. :315-318 May, 2024
Relation: 2024 9th International Conference on Electronic Technology and Information Science (ICETIS)
قاعدة البيانات: IEEE Xplore Digital Library