التفاصيل البيبلوغرافية
| العنوان: |
A Semiconductor Manufacturing Final Test Yield Classification Using Random Forest |
| المؤلفون: |
Dineshkumar, R., Aluvala, Srinivas, Srinath, Suma, Alsalami, Zaid, Krishnaprasath, V T |
| المصدر: |
2024 Second International Conference on Data Science and Information System (ICDSIS) Data Science and Information System (ICDSIS), 2024 Second International Conference on. :1-4 May, 2024 |
| Relation: |
2024 Second International Conference on Data Science and Information System (ICDSIS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
