مؤتمر
A High-Precision Particle Detection ROIC With an Active Shaper in 40 nm CMOS with Sub 200 aC Sensitivity
العنوان: | A High-Precision Particle Detection ROIC With an Active Shaper in 40 nm CMOS with Sub 200 aC Sensitivity |
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المؤلفون: | Zaki, Alireza Mohammad, Nihtianov, Stoyan |
المصدر: | 2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2024 IEEE 33rd International Symposium on. :1-6 Jun, 2024 |
Relation: | 2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350394085 |
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تدمد: | 21635145 |
DOI: | 10.1109/ISIE54533.2024.10595727 |