Experimental Study on Transition Loss of On-Chip SIW Interconnects and Transmission Lines Using Two De-Embedding Reference Planes in 200 GHz Band Frequency

التفاصيل البيبلوغرافية
العنوان: Experimental Study on Transition Loss of On-Chip SIW Interconnects and Transmission Lines Using Two De-Embedding Reference Planes in 200 GHz Band Frequency
المؤلفون: Thapa, Samundra K., Pokharel, Ramesh K., Barakat, Adel, Amakawa, Shuhei, Mubarak, Mohamed H., Hara, Shinsuke, Watanabe, Issei, Kasamatsu, Akifumi
المصدر: 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024 Microwave Symposium - IMS 2024, 2024 IEEE/MTT-S International. :694-697 Jun, 2024
Relation: 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350375046
تدمد:25767216
DOI:10.1109/IMS40175.2024.10600291