التفاصيل البيبلوغرافية
| العنوان: |
Monitoring and analyzing the dynamic junction temperature distribution of RF power transistors by using RM-50 infrared micro imager |
| المؤلفون: |
Guang-bo Gao, Jin-jin Zhu, Wu-chen Wu |
| المصدر: |
Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium Semiconductor Thermal and Temperature Measurement Symposium, 1988. SEMI-THERM IV., Fourth Annual IEEE. :84-87 1988 |
| Relation: |
1988 Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
