دورية أكاديمية
Modeling the Coupled Charge Trapping Dynamics in FeFETs for Reliability Characterizations
| العنوان: | Modeling the Coupled Charge Trapping Dynamics in FeFETs for Reliability Characterizations |
|---|---|
| المؤلفون: | Cai, P., Li, H., Ji, Z., Zhang, L., Wang, R., Huang, R. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5779-5783 Sep, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
|---|---|
| DOI: | 10.1109/TED.2024.3426430 |