التفاصيل البيبلوغرافية
العنوان: |
S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz |
المؤلفون: |
Manning, Lewis, Salter, Martin, Wickham, Martin, Robador, Ana, Sibonjic, Osman, Sarcevic, Sani, Cohodarevic, Semir, Betta, Giovanni, Capriglione, Domenico, Miele, Gianfranco |
المصدر: |
2024 IEEE International Symposium on Measurements & Networking (M&N) Measurements & Networking (M&N), 2024 IEEE International Symposium on. :1-6 Jul, 2024 |
Relation: |
2024 IEEE International Symposium on Measurements & Networking (M&N) |
قاعدة البيانات: |
IEEE Xplore Digital Library |