S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz

التفاصيل البيبلوغرافية
العنوان: S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz
المؤلفون: Manning, Lewis, Salter, Martin, Wickham, Martin, Robador, Ana, Sibonjic, Osman, Sarcevic, Sani, Cohodarevic, Semir, Betta, Giovanni, Capriglione, Domenico, Miele, Gianfranco
المصدر: 2024 IEEE International Symposium on Measurements & Networking (M&N) Measurements & Networking (M&N), 2024 IEEE International Symposium on. :1-6 Jul, 2024
Relation: 2024 IEEE International Symposium on Measurements & Networking (M&N)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350370539
تدمد:26395061
DOI:10.1109/MN60932.2024.10615784