التفاصيل البيبلوغرافية
| العنوان: |
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories |
| المؤلفون: |
Vargas, Fabian, Galstyan, Vache, Harutyunyan, Gurgen, Zorian, Yervant |
| المصدر: |
2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-6 Jul, 2024 |
| Relation: |
2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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