التفاصيل البيبلوغرافية
| العنوان: |
Advancing Robust Few-shot Surface Defect Detection through Meta-learning |
| المؤلفون: |
Putri, Wenny Ramadha, Li, Yung-Hui, Wang, Jia Ching |
| المصدر: |
2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV) Integrated Circuits, Design, and Verification (ICDV), 2024 9th International Conference on. :45-48 Jun, 2024 |
| Relation: |
2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
