التفاصيل البيبلوغرافية
العنوان: |
Advancing Robust Few-shot Surface Defect Detection through Meta-learning |
المؤلفون: |
Putri, Wenny Ramadha, Li, Yung-Hui, Wang, Jia Ching |
المصدر: |
2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV) Integrated Circuits, Design, and Verification (ICDV), 2024 9th International Conference on. :45-48 Jun, 2024 |
Relation: |
2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV) |
قاعدة البيانات: |
IEEE Xplore Digital Library |