التفاصيل البيبلوغرافية
| العنوان: |
Implementation of Silicon Wafer Defect Classification Web application using Deep Learning |
| المؤلفون: |
Akshaya, Bura, Raga, Vavilala Rohitha, Reddy, Gundla Sridhar, Chaitanya, B. Krishna |
| المصدر: |
2024 International Conference on Advancements in Power, Communication and Intelligent Systems (APCI) Advancements in Power, Communication and Intelligent Systems (APCI), 2024 International Conference on. :1-6 Jun, 2024 |
| Relation: |
2024 International Conference on Advancements in Power, Communication and Intelligent Systems (APCI) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
