مؤتمر
Implementation of Silicon Wafer Defect Classification Web application using Deep Learning
العنوان: | Implementation of Silicon Wafer Defect Classification Web application using Deep Learning |
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المؤلفون: | Akshaya, Bura, Raga, Vavilala Rohitha, Reddy, Gundla Sridhar, Chaitanya, B. Krishna |
المصدر: | 2024 International Conference on Advancements in Power, Communication and Intelligent Systems (APCI) Advancements in Power, Communication and Intelligent Systems (APCI), 2024 International Conference on. :1-6 Jun, 2024 |
Relation: | 2024 International Conference on Advancements in Power, Communication and Intelligent Systems (APCI) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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