التفاصيل البيبلوغرافية
| العنوان: |
Physics-Informed Machine Learning for Robust Remaining Useful Life estimation of Power MOSFETs |
| المؤلفون: |
Fassi, Youssof, Heiries, Vincent, Boutet, Jerome, Boisseau, Sebastien |
| المصدر: |
2024 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2024 IEEE International Conference on. :399-406 Jun, 2024 |
| Relation: |
2024 IEEE International Conference on Prognostics and Health Management (ICPHM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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