مؤتمر
Operando Imaging of Strain and Defects at the Nanoscale
| العنوان: | Operando Imaging of Strain and Defects at the Nanoscale |
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| المؤلفون: | Barringer, Julie, N'gom, Moussa, Fohtung, Edwin |
| المصدر: | 2024 IEEE 24th International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2024 IEEE 24th International Conference on. :483-488 Jul, 2024 |
| Relation: | 2024 IEEE 24th International Conference on Nanotechnology (NANO) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350386240 |
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| تدمد: | 19449380 |
| DOI: | 10.1109/NANO61778.2024.10628841 |