An Experimental Characterization of Combined RowHammer and RowPress Read Disturbance in Modern DRAM Chips

التفاصيل البيبلوغرافية
العنوان: An Experimental Characterization of Combined RowHammer and RowPress Read Disturbance in Modern DRAM Chips
المؤلفون: Luo, Haocong, Yuksel, Ismail Emir, Olgun, Ataberk, Yaglikci, A. Giray, Sadrosadati, Mohammad, Mutlu, Onur
المصدر: 2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) DSN-S Dependable Systems and Networks - Supplemental Volume (DSN-S), 2024 54th Annual IEEE/IFIP International Conference on. :6-11 Jun, 2024
Relation: 2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350395709
تدمد:2833292X
DOI:10.1109/DSN-S60304.2024.00013