On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement

التفاصيل البيبلوغرافية
العنوان: On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement
المؤلفون: Seck, Daouda, Allal, Djamel, Haddadi, Kamel
المصدر: 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA) Wireless Technology & Applications (ISWTA), 2024 IEEE Symposium on. :260-263 Jul, 2024
Relation: 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350351354
تدمد:23247851
DOI:10.1109/ISWTA62130.2024.10651788