مؤتمر
On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement
العنوان: | On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement |
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المؤلفون: | Seck, Daouda, Allal, Djamel, Haddadi, Kamel |
المصدر: | 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA) Wireless Technology & Applications (ISWTA), 2024 IEEE Symposium on. :260-263 Jul, 2024 |
Relation: | 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350351354 |
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تدمد: | 23247851 |
DOI: | 10.1109/ISWTA62130.2024.10651788 |