مؤتمر
PMMA polymer film characterization using thickness-shear mode (TSM) quartz resonator
| العنوان: | PMMA polymer film characterization using thickness-shear mode (TSM) quartz resonator |
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| المؤلفون: | Morray, B., Suiqiong Li, Hossenlopp, J., Cernosek, R., Josse, F. |
| المصدر: | Proceedings of the 2002 IEEE International Frequency Control Symposium and PDA Exhibition (Cat. No.02CH37234) Frequency control symposium Frequency Control Symposium and PDA Exhibition, 2002. IEEE International. :294-300 2002 |
| Relation: | Proceedings of Frequency Control Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780370821 9780780370821 |
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| DOI: | 10.1109/FREQ.2002.1075895 |