Raman spectroscopy of Si/sub x/Ge/sub 1-x/ compositional and temperature dependence

التفاصيل البيبلوغرافية
العنوان: Raman spectroscopy of Si/sub x/Ge/sub 1-x/ compositional and temperature dependence
المؤلفون: Lorenc, M., Sik, J.
المصدر: The Fourth International Conference on Advanced Semiconductor Devices and Microsystem Advanced semiconductor devices and microsystems Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on. :103-106 2002
Relation: Proceedings of ASDAM'02 (4th International Conference on Advanced Semiconductor Devices and Microsystems)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:078037276X
9780780372764
DOI:10.1109/ASDAM.2002.1088486