مؤتمر
Total-dose tolerance of the commercial American Microsystems Inc. (AMI) 0.35-/spl mu/m CMOS process
| العنوان: | Total-dose tolerance of the commercial American Microsystems Inc. (AMI) 0.35-/spl mu/m CMOS process |
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| المؤلفون: | Lacoe, R.C., Osborn, J.V., Mayer, D.C., Brown, S. |
| المصدر: | RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) Radiation and its effects on components and systems Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on. :464-468 2001 |
| Relation: | RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780373138 9780780373136 |
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| DOI: | 10.1109/RADECS.2001.1159324 |