مؤتمر
Characterizing and predicting value degree of use
العنوان: | Characterizing and predicting value degree of use |
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المؤلفون: | Butts, J.A., Sohi, G.S. |
المصدر: | 35th Annual IEEE/ACM International Symposium on Microarchitecture, 2002. (MICRO-35). Proceedings. Microarchitecture Microarchitecture, 2002. (MICRO-35). Proceedings. 35th Annual IEEE/ACM International Symposium on. :15-26 2002 |
Relation: | Proceedings 35th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-35) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0769518591 9780769518596 |
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تدمد: | 10724451 |
DOI: | 10.1109/MICRO.2002.1176235 |