مؤتمر
Channel width test data compression under a limited number of test inputs and outputs
| العنوان: | Channel width test data compression under a limited number of test inputs and outputs |
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| المؤلفون: | Ichihara, H., Kinoshita, K., Isodono, K., Nishikawa, S. |
| المصدر: | 16th International Conference on VLSI Design, 2003. Proceedings. VLSI design VLSI Design, 2003. Proceedings. 16th International Conference on. :329-334 2003 |
| Relation: | Proceedings 16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769518680 9780769518688 |
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| تدمد: | 10639667 |
| DOI: | 10.1109/ICVD.2003.1183158 |