مؤتمر
A practical methodology for multi-modality electromigration lifetime prediction
| العنوان: | A practical methodology for multi-modality electromigration lifetime prediction |
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| المؤلفون: | Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang |
| المصدر: | IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002 |
| Relation: | IEEE International Integrated Reliability Workshop |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780375580 9780780375581 |
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| DOI: | 10.1109/IRWS.2002.1194232 |