The impact of NBTI and HCI on deep sub-micron PMOSFETs' lifetime

التفاصيل البيبلوغرافية
العنوان: The impact of NBTI and HCI on deep sub-micron PMOSFETs' lifetime
المؤلفون: Chul-Hee Jeon, Sam-Young Kim, Hyun-Soo Kim, Chae-Bog Rim
المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :130-132 2002
Relation: IEEE International Integrated Reliability Workshop
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780375580
9780780375581
DOI:10.1109/IRWS.2002.1194249