مؤتمر
The impact of NBTI and HCI on deep sub-micron PMOSFETs' lifetime
العنوان: | The impact of NBTI and HCI on deep sub-micron PMOSFETs' lifetime |
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المؤلفون: | Chul-Hee Jeon, Sam-Young Kim, Hyun-Soo Kim, Chae-Bog Rim |
المصدر: | IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :130-132 2002 |
Relation: | IEEE International Integrated Reliability Workshop |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780375580 9780780375581 |
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DOI: | 10.1109/IRWS.2002.1194249 |