مؤتمر
Correlation of the V/sub T/ drift in a-Si:H TFT to the optically observed flicker increase in AMLCD
| العنوان: | Correlation of the V/sub T/ drift in a-Si:H TFT to the optically observed flicker increase in AMLCD |
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| المؤلفون: | Chung-Che Huang, Constable, J., Yost, B., Greene, R. |
| المصدر: | 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :372-377 2003 |
| Relation: | International Reliability Physics Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780376498 9780780376496 |
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| DOI: | 10.1109/RELPHY.2003.1197776 |