دورية أكاديمية
Simulation of oxide trapping noise in submicron n-channel MOSFETs
| العنوان: | Simulation of oxide trapping noise in submicron n-channel MOSFETs |
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| المؤلفون: | Fan-Chi Hou, Bosman, G., Law, M.E. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(3):846-852 Mar, 2003 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2003.811395 |