دورية أكاديمية
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future
| العنوان: | Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future |
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| المؤلفون: | Reed, R.A., Kinnison, J., Pickel, J.C., Buchner, S., Marshall, P.W., Kniffin, S., LaBel, K.A. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 50(3):622-634 Jun, 2003 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2003.813331 |