مؤتمر
VHDL modeling of built-in-self-test (BIST) for system on chip (SOC) design
| العنوان: | VHDL modeling of built-in-self-test (BIST) for system on chip (SOC) design |
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| المؤلفون: | Reaz, M.B.I., Islam, S.Z. |
| المصدر: | ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575) Semiconductor electronics Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on. :222-225 2002 |
| Relation: | ICSE 2002. IEEE International Conference on Semiconductor Electronics. Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780375785 9780780375789 |
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| DOI: | 10.1109/SMELEC.2002.1217811 |