Advanced i-PVD barrier metal deposition technology for 90 nm Cu interconnects

التفاصيل البيبلوغرافية
العنوان: Advanced i-PVD barrier metal deposition technology for 90 nm Cu interconnects
المؤلفون: Park, K.-C., Kim, I.-R., Suh, B.-S., Choi, S.-M., Song, W.-S., Wee, Y.-J., Lee, S.-G., Chung, J.-S., Chung, J.-H., Hah, S.-R., Ahn, J.-H., Lee, K.-T., Kang, H.-K., Suh, K.-P.
المصدر: Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) Interconnect technology Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International. :165-167 2003
Relation: IEEE International Interconnect Technology Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780377974
9780780377974
DOI:10.1109/IITC.2003.1219743