مؤتمر
Laser/infrared evaluation of TAB innerlead bond integrity
العنوان: | Laser/infrared evaluation of TAB innerlead bond integrity |
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المؤلفون: | Teoh, H., McGeary, M., Ling, J. |
المصدر: | 40th Conference Proceedings on Electronic Components and Technology Electronic Components and Technology Conference, 1990. ., 40th. :442-449 vol.1 1990 |
Relation: | 40th Conference Proceedings on Electronic Components and Technology |
قاعدة البيانات: | IEEE Xplore Digital Library |
DOI: | 10.1109/ECTC.1990.122227 |
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