Laser/infrared evaluation of TAB innerlead bond integrity

التفاصيل البيبلوغرافية
العنوان: Laser/infrared evaluation of TAB innerlead bond integrity
المؤلفون: Teoh, H., McGeary, M., Ling, J.
المصدر: 40th Conference Proceedings on Electronic Components and Technology Electronic Components and Technology Conference, 1990. ., 40th. :442-449 vol.1 1990
Relation: 40th Conference Proceedings on Electronic Components and Technology
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
DOI:10.1109/ECTC.1990.122227