مؤتمر
Debug architecture for system on chip taking full advantage of the test access port
| العنوان: | Debug architecture for system on chip taking full advantage of the test access port |
|---|---|
| المؤلفون: | Moerman, E., Bocq, S., Verfaillie, J. |
| المصدر: | The Eighth IEEE European Test Workshop, 2003. Proceedings. European test workshop Test Workshop, 2003. Proceedings. The Eighth IEEE European. :155-159 2003 |
| Relation: | 8th IEEE European Test Workshop (ETW 03) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769519083 9780769519081 |
|---|---|
| تدمد: | 15301877 |
| DOI: | 10.1109/ETW.2003.1231683 |