مؤتمر
Exhaustive test of several dependable memory architectures designed by GRAAL tool
| العنوان: | Exhaustive test of several dependable memory architectures designed by GRAAL tool |
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| المؤلفون: | Bertuccelli, F., Bigongiari, F., Brogna, A.S., Di Natale, G., Prinetto, P., Saletti, R. |
| المصدر: | 2003 Test Symposium Twelfth asian symposium Test Symposium, 2003. ATS 2003. 12th Asian. :32-35 2003 |
| Relation: | Proceedings of the Twelfth Asian Symposium, ATS 2003 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769519512 9780769519517 |
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| تدمد: | 10817735 |
| DOI: | 10.1109/ATS.2003.1250779 |