Thermal modelling of hot spot formation at deep level centers in silicon transistor under laser irradiation

التفاصيل البيبلوغرافية
العنوان: Thermal modelling of hot spot formation at deep level centers in silicon transistor under laser irradiation
المؤلفون: Galateanu, L., Tibeica, C., Cobianu, C., Apostol, D., Damian, V.
المصدر: 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) Semiconductor conference. CAS 2003 Semiconductor Conference, 2003. CAS 2003. International. 2:293-296 Vol. 2 2003
Relation: 2003 International Semiconductor Conference. CAS 2003 Proceedings
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780378210
9780780378216
DOI:10.1109/SMICND.2003.1252438