Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors

التفاصيل البيبلوغرافية
العنوان: Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors
المؤلفون: Zhenqiu Ning, De Schepper, L., Gillon, R., Tack, M.
المصدر: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :79-82 2003
Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780379993
9780780379992
DOI:10.1109/ESSDERC.2003.1256815