مؤتمر
Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors
العنوان: | Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors |
---|---|
المؤلفون: | Zhenqiu Ning, De Schepper, L., Gillon, R., Tack, M. |
المصدر: | ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :79-82 2003 |
Relation: | ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03 |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!