دورية أكاديمية
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits
| العنوان: | FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits |
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| المؤلفون: | Kuji, N., Tamama, T., Nagatani, M. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 5(2):313-319 Apr, 1986 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
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| DOI: | 10.1109/TCAD.1986.1270201 |