Cooling of a stacked multichip module - tests and validations

التفاصيل البيبلوغرافية
العنوان: Cooling of a stacked multichip module - tests and validations
المؤلفون: Chen, X.Y., Toh, K.C., Chai, J.C., Wong, T.N., Pinjala, D., Navas, O.K., Ganesh, Hengyun Zhang, Kripesh, V.
المصدر: Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003) Electronics packaging technology Electronics Packaging Technology, 2003 5th Conference (EPTC 2003). :633-637 2003
Relation: Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780382056
9780780382053
DOI:10.1109/EPTC.2003.1271595