SPICE-compatible thermal simulation with lumped circuit modeling for thermal reliability analysis based on modeling order reduction

التفاصيل البيبلوغرافية
العنوان: SPICE-compatible thermal simulation with lumped circuit modeling for thermal reliability analysis based on modeling order reduction
المؤلفون: Ting-Yuan Wang, Charlie Chung-Ping Chen
المصدر: International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720) Quality electronic design Quality Electronic Design, 2004. Proceedings. 5th International Symposium on. :357-362 2004
Relation: Proceedings. 5th International Symposium on Quality Electronic Design
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0769520936
9780769520933
DOI:10.1109/ISQED.2004.1283700