مؤتمر
Generating At-Speed array fail maps with low-speed ATE
| العنوان: | Generating At-Speed array fail maps with low-speed ATE |
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| المؤلفون: | Nelms, M., Gorman, K., Anand, D. |
| المصدر: | 22nd IEEE VLSI Test Symposium, 2004. Proceedings. VLSI test symposium VLSI Test Symposium, 2004. Proceedings. 22nd IEEE. :87-92 2004 |
| Relation: | Proceedings. 22nd IEEE VLSI Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769521347 9780769521343 |
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| تدمد: | 10930167 |
| DOI: | 10.1109/VTEST.2004.1299230 |