دورية أكاديمية
An endurance evaluation method for flash EEPROM
| العنوان: | An endurance evaluation method for flash EEPROM |
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| المؤلفون: | Zous, N.-K., Yin-Jen Chen, Chi-Yuan Chin, Tsai, W.-J., Tao-Cheng Lu, Ming-Shiang Chen, Wen-Pin Lu, Tahui Wang, Pan, S.C., Chih-Yuan Lu |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(5):720-725 May, 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2004.826871 |