مؤتمر
Characterization and model of 4-terminal RF CMOS with bulk effect
| العنوان: | Characterization and model of 4-terminal RF CMOS with bulk effect |
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| المؤلفون: | Yang, M.T., Wang, Y.J., Yeh, T.J., Ho, P.P.C., Chia, Y.T., Young, K.L. |
| المصدر: | Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :189-193 2004 |
| Relation: | Proceedings of the 2004 International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780382625 9780780382626 |
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| DOI: | 10.1109/ICMTS.2004.1309477 |