مؤتمر
Hot-carrier induced degradation of offset gated polysilicon TFTs
العنوان: | Hot-carrier induced degradation of offset gated polysilicon TFTs |
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المؤلفون: | Hatzopoulos, A., Dimitriadis, C.A., Pananakakis, G., Ghibaudo, G., Kamarinos, G. |
المصدر: | 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) Microelectronics Microelectronics, 2004. 24th International Conference on. 2:693-695 vol.2 2004 |
Relation: | 2004 24th International Conference on Microelectronics |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780381661 9780780381667 |
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DOI: | 10.1109/ICMEL.2004.1314925 |