Hot-carrier induced degradation of offset gated polysilicon TFTs

التفاصيل البيبلوغرافية
العنوان: Hot-carrier induced degradation of offset gated polysilicon TFTs
المؤلفون: Hatzopoulos, A., Dimitriadis, C.A., Pananakakis, G., Ghibaudo, G., Kamarinos, G.
المصدر: 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) Microelectronics Microelectronics, 2004. 24th International Conference on. 2:693-695 vol.2 2004
Relation: 2004 24th International Conference on Microelectronics
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780381661
9780780381667
DOI:10.1109/ICMEL.2004.1314925