مؤتمر
New insights into the charge loss components in a SONOS flash memory cell before and after long term cycling
| العنوان: | New insights into the charge loss components in a SONOS flash memory cell before and after long term cycling |
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| المؤلفون: | Lin, Y.T., Chiang, P.-Y., Lai, C.S., Chung, S.S., Chou, G., Huang, C.T., Chen, P., Chu, C.H., Hsu, C.C.-H. |
| المصدر: | Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :239-242 2004 |
| Relation: | Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780384547 9780780384545 |
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| DOI: | 10.1109/IPFA.2004.1345610 |