Analysis of loss and junction temperature in power semiconductors of the matrix converter using simple simulation methods

التفاصيل البيبلوغرافية
العنوان: Analysis of loss and junction temperature in power semiconductors of the matrix converter using simple simulation methods
المؤلفون: Odaka, A., Itoh, J., Sato, I., Ohguchi, H., Kodachi, H., Eguchi, N., Umida, H.
المصدر: Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting. Industry applications conference Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE. 2:850-855 vol.2 2004
Relation: Conference Record of the 2004 IEEE Industry Applications Conference. 39th IAS Annual Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780384865
9780780384866
تدمد:01972618
DOI:10.1109/IAS.2004.1348512