Self-heating effect on device characteristics of GaN/AlGaN HEMTs: 2D Monte Carlo device simulation

التفاصيل البيبلوغرافية
العنوان: Self-heating effect on device characteristics of GaN/AlGaN HEMTs: 2D Monte Carlo device simulation
المؤلفون: Fujishiro, H.I., Mikami, N., Takei, T., Izawa, M., Moku, T., Ohtuka, K.
المصدر: 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings (IEEE Cat. No.03TH8767) Compound semiconductors Compound Semiconductors: Post-Conference Proceedings, 2003 International Symposium on. :152-157 2003
Relation: 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780386140
9780780386143
DOI:10.1109/ISCSPC.2003.1354447