مؤتمر
Triple junctions for reduced impact of offset spacer variation on CMOS device parameters
| العنوان: | Triple junctions for reduced impact of offset spacer variation on CMOS device parameters |
|---|---|
| المؤلفون: | Jurczak, M., Rooyackers, R., De Keersgieter, A., Kunnen, E., Henson, K., Richard, O., Dachs, C. |
| المصدر: | Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :145-148 2004 |
| Relation: | Proceedings of the 34th European Solid-State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780384784 9780780384781 |
|---|---|
| DOI: | 10.1109/ESSDER.2004.1356510 |