دورية أكاديمية
Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress
| العنوان: | Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress |
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| المؤلفون: | Blaho, M., Zullino, L., Wolf, H., Stella, R., Andreini, A., Gieser, H.A., Pogany, D., Gornik, E. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):535-541 Sep, 2004 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2004.836164 |